Proceedings of the Symposium on the Degradation of Electronic Devices Due to Device Operation as Well as Crystalline and Process-Induced Defects by Symposium on the Degradation of Electronic Devices Due to Device Operation as Well as Crystalline and Process-Induced Defects (1993 New Orleans, La.)

Cover of: Proceedings of the Symposium on the Degradation of Electronic Devices Due to Device Operation as Well as Crystalline and Process-Induced Defects | Symposium on the Degradation of Electronic Devices Due to Device Operation as Well as Crystalline and Process-Induced Defects (1993 New Orleans, La.)

Published by Electrochemical Society in Pennington, NJ .

Written in English

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Subjects:

  • Electronic apparatus and appliances -- Deterioration -- Congresses.,
  • Electronics -- Materials -- Deterioration -- Congresses.

Edition Notes

Book details

Other titlesDegradation of electronic devices due to device operation as well as crystalline and process-induced defects.
Statementedited by H.J. Queisser ... [et al.] ; [sponsored by] Electronics and Dielectric Science and Technology Divisions.
SeriesProceedings ;, v. 94-1, Proceedings (Electrochemical Society) ;, v. 94-1.
ContributionsQueisser, Hans J., 1931-, Electrochemical Society. Electronics Division., Electrochemical Society. Dielectric Science and Technology Division.
Classifications
LC ClassificationsTK7870 .S956 1993
The Physical Object
Paginationviii, 319 p. :
Number of Pages319
ID Numbers
Open LibraryOL1440999M
ISBN 101566770378
LC Control Number93072866
OCLC/WorldCa30693977

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